Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits Michael L. Bushnell, Vishwani D. Agrawal

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Publication details: Boston Springer 2000Description: xviii, 690 p. : ill. ; 26 cmISBN:

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	621.395 BUS (Browse shelf(Opens below))	Available		324807

Includes bibliographical references (p. [631]-670) and index

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