Advances in materials characterization editors, G Amarendra, Baldev Raj, M H Manghnani ; editor-in-chief, Baldev Raj

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Publication details: Hyderabad ; Boca Raton Universities Press ; CRC Press 2007Description: [iv], 220 p. : ill. (some col.) ; 25cmISBN:

9781420047295

Subject(s):

Materials - Testing

DDC classification:

620.110287 AMA

Item type: Books

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Current library	Call number	Status	Date due	Barcode
Anna Centenary Library	620.110287 AMA (Browse shelf(Opens below))	Available		150748

Includes bibliographical references and index. <strong>Contents:</strong> <ul> <li>Introduction to Materials Characterization</li> <li>Atomistic Characterization of Materials using Scanning Tunneling Microscopy / Spectroscopy</li> <li>Recent Advances in Characterization of Materials using Electron Microscopy</li> <li>X-ray Reflectivity: A Non-destructive Technique for the Study of Thin Films and Multilayers</li> <li>Latest Trends in Ultrasonic Technique for Materials Characterization</li> <li>Characterization of Soft Condensed Matter using Confocal Microscopy</li> <li>Characterization of Defects in Semiconductor Devices using Positron Annihilation</li> <li>Elasticity Characterization of Covalent (B-C-N) Hard Materials and Films by Brillouin Scattering.</li> </ul>

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Advances in materials characterization editors, G Amarendra, Baldev Raj, M H Manghnani ; editor-in-chief, Baldev Raj

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