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Results of search for 'ccl=au:"Tanabe, Hiroyoshi "'
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Tanabe, Hiroyoshi
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Proceedings of SPIE-...
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1.
Image from Google Jackets
Photomask and next-generation lithography mask technology X : 16-18 April, 2003, Yokohama, Japan
Hiroyoshi Tanabe, editor ; sponsored by PMJ--Photomask Japan, BACUS--the international technical group of SPIE dedicated to the advancement of photomask technology, [and] SPIE--the International Society for Optical Engineering ; cooperating organizations for symposium, the Japan Society of Applied Physics ... [et al.] ; cooperating organization for technical exhibit, SEMI Japan ; supported by Yokohama City ; published by SPIE--the International Society for Optical Engineering
by
Tanabe, Hiroyoshi
BACUS (Technical group), Ōyō Butsuri Gakkai, Photomask Japan, Photomask Japan 2003 (2003 : Yokohama, Japan), Semiconductor Equipment and Materials International (Japan), Society of Photo-optical Instrumentation Engineers
Publication details:
Bellingham, WA
SPIE
c2003
Availability:
Items available for loan:
Anna Centenary Library
(1)
Call number:
621.381531 TAN
.
2.
Image from Google Jackets
Photomask and next-generation lithography mask technology XI : 14-16 April, 2004, Yokohama, Japan
Hiroyoshi Tanabe, editor ; sponsored by PMJ--Photomask Japan, BACUS--the international technical group of SPIE dedicated to the advancement of photomask technology, [and] SPIE--The International Society for Optical Engineering ; cooperating organizations, the Institute of Electrical Engineers of Japan ... (et al.) ; co-organized by Yokohama City (Japan) ; published by SPIE--The International Society for Optical Engineering
by
Tanabe, Hiroyoshi
BACUS (Technical group), Institute of Electrical and Electronics Engineers. Japan Section, Photomask Japan, Semiconductor Equipment and Materials International (Japan), Society of Photo-optical Instrumentation Engineers
Publication details:
Bellingham, WA
SPIE
c2004
Availability:
Items available for loan:
Anna Centenary Library
(2)
Call number:
621.381531 TAN, ..
.
3.
Image from Google Jackets
Photomask And Next-generation Lithography Mask Technology Xi : 14-16 April, 2004, Yokohama, Japan
/ edited by Hiroyoshi Tanabe
by
Tanabe, Hiroyoshi
Series:
Proceedings of SPIE--the International Society for Optical Engineering
; v. 5446
Edition:
1st ed.
Language:
English
Publication details:
Bellingham
Spie
c2004
Availability:
Items available for reference:
Anna Centenary Library: Not for loan
(1)
Call number:
621.381531 TAN
.
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