TY  - BOOK
AU  - Zhang, J. C
AU  - Styblinski, M. A
TI  - Yield and variability optimization of integrated circuits
SN  - 9780792395515
SN  - 94044624
U1  - 623815 ZHA 
PY  - 1995///
CY  - Dordrecht ; Boston
PB  - Kluwer Academic Publishers
KW  - Integrated circuits - Defects
KW  - Integrated circuits - Design and construction - Statistical methods
KW  - Integrated circuits - Reliability
N1  - Includes bibliographical references (p. 221-231) and index
ER  -