Zhang, J. C <br/><br/>
Yield and variability optimization of integrated circuits 
J.C. Zhang, M.A. Styblinski 
 - Dordrecht ; Boston  Kluwer Academic Publishers  1995 
 - xv, 234 p. : ill. ; 25 cm 
<br/><br/> Includes bibliographical references (p. 221-231) and index 
<br/><br/><label>ISBN: </label>9780792395515 
<br/><br/><label>ISSN: </label>94044624 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits - Defects<br/>Integrated circuits - Design and construction - Statistical methods<br/>Integrated circuits - Reliability
<br/><br/><label>Dewey Class. No.: </label>623815 ZHA