Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA 
Peisen S. Huang, chair/editor ; sponsored and published by by SPIE--the International Society for Optical Engineering 
 - Bellingham, WA  SPIE  2006 
 - 1 v. (various pagings) : ill. ; 28 cm. 
<br/><br/> Includes bibliographical references and author index 
<br/><br/><label>ISBN: </label>9780819464804 
<br/><br/><label>ISSN: </label>2007273895 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer vision - Congresses<br/>Imaging systems - Congresses<br/>Metrology - Congresses<br/>Optical measurements - Congresses<br/>Quality control - Optical methods - Congresses<br/>Three-dimensional display systems - Congresses
<br/><br/><label>Dewey Class. No.: </label>681.25 HUA