TY  - BOOK
AU  - Harding, Kevin G
ED  - Society of Photo-optical Instrumentation Engineers
TI  - Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA
SN  - 9780819460240
SN  - 200627602
U1  - 681.25 HAR 
PY  - 2005///
CY  - Bellingham, WA
PB  - SPIE
KW  - Computer vision - Congresses
KW  - Imaging systems - Congresses
KW  - Metrology - Congresses
KW  - Optical measurements - Congresses
KW  - Quality control - Optical methods - Congresses
KW  - Three-dimensional display systems - Congresses
N1  - Previous conference entitled: Two- and three-dimensional vision systems for inspection, control, and metrology. Includes bibliographical references and author index
ER  -