TY  - BOOK
AU  - Ker, Ming-Dou
AU  - Hsu, Sheng-Fu
TI  - Transient-induced latchup in CMOS integrated circuits
SN  - 9780470824078
SN  - 200804560
U1  - 621.395 KER 
PY  - 2009///
CY  - Singapore ; Hoboken, NJ ; [Piscataway, NJ]
PB  - IEEE Press, Wiley
KW  - Metal oxide semiconductors, Complementary - Defects
KW  - Metal oxide semiconductors, Complementary - Reliability
N1  - Includes bibliographical references and index
ER  -