Trace analysis with nanomaterials 
edited by David T. Pierce and Julia Xiaojun Zhao 
 - Weinheim  Wiley-VCH  2010 
 - xxi, 396 p. : ill. (some col.) ; 25 cm. 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9783527323500 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanostructured materials<br/>Trace analysis
<br/><br/><label>Dewey Class. No.: </label>543 PIE