Three-dimensional and multidimensional microscopy : image acquisition and processing XVII : 25-28 January 2010, Sa Francisco, California, United States 
Jose-Angel Conchello ... [et al.], editors ; sponsored and published by SPIE 
 - Bellingham, WA  SPIE  c2010 
 - 1 v. (various pagings) : ill. ; 28 cm. 
<br/><br/><label>ISBN: </label>9780819479662 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronics, Medical -- instrumentation -- Congresses<br/>Microscopy -- methods -- Congresses
<br/><br/><label>Dewey Class. No.: </label>570.282 CON