Wang, Zhong Lin, <br/><br/>
Reflection Electron Microscopy and Spectroscopy for Surface Analysis : 

 -  Cambridge University Press,  2005. 
 - 460 pages 
<br/><br/><label>ISBN: </label>9780521017954 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Technology & Engineering.
<br/><br/><label>Dewey Class. No.: </label>620.44  / WAN