Murrer, Robert Lee, <br/><br/>
Hardware-in-the-loop Testing VI : 

 -  Society of Photo Optical,  2001. 
 - 530 pages 
<br/><br/><label>ISBN: </label>9780819440617 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Technology & Engineering.
<br/><br/><label>Dewey Class. No.: </label>623.4519  / MUR