Photomask And Next-generation Lithography Mask Technology Xi : 14-16 April, 2004, Yokohama, Japan
/ edited by Hiroyoshi Tanabe
- 1st ed.
- Bellingham Spie c2004
- xiii, 990 p. : ill. ; 28 cm.
- Proceedings of SPIE--the International Society for Optical Engineering v. 5446 .