Sheppard,  W John. <br/><br/>
Research Perspectives And Case Studies In System Test And Diagnosis 
/John W. Sheppard,  William Randolph Simpson 
 - , Boston,   Kluwer Aacdemic Publishers   ©1998 
 - xiv, 232 pages :   illustrations ;   25 cm. 
<br/><br/>Includes index 
<br/><br/> The works included in this volume are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998. In this volume, a select group of workshop 
<br/><br/><label>ISBN: </label>9780792382638 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Appareils Électroniques Essais Défauts Électriques Localisation Electric Fault Location Electronic Apparatus And Appliances Testing
<br/><br/><label>Dewey Class. No.: </label>005.14  / SHE