Testing Static Random Access Memories  : defects, fault models and test patterns 
Said Hamdioui  
 - Boston  Kluwar Academic Publishers  2004 
 - xx, 221 p.  24 cm. 
<br/><br/>Includes index 
<br/><br/><label>ISBN: </label>9781402077524 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Random Access Memory Testing
<br/><br/><label>Dewey Class. No.: </label>004.53  / HAM