Cai Kai- Yuan  <br/><br/>
Software Defect And Operational Profile Modeling 

 - 1st edition 
 - London  Kluwer academic   1998 
 - 268pg.  25cm. 
<br/><br/>Includes index 
<br/><br/><label>ISBN: </label>9780792382591 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Software engineering.<br/>Software Reliability Engineering
<br/><br/><label>Dewey Class. No.: </label>003.3  / CAI