TY  - BOOK
AU  - David, René
TI  - Random testing of digital circuits : theory and applications
SN  - 824701828
SN  - 98002765
U1  - 621.3815 DAV 
PY  - 1998///
CY  - New York
PB  - Marcel Dekker
KW  - Digital integrated circuits - Testing
N1  - Includes bibliographical references (p. 447-461) and index
ER  -