David, René <br/><br/>
Random testing of digital circuits : theory and applications 
René David 
 - New York  Marcel Dekker  1998 
 - xix, 475 p. : ill. ; 24 cm 
<br/><br/> Includes bibliographical references (p. 447-461) and index 
<br/><br/><label>ISBN: </label>824701828 
<br/><br/><label>ISSN: </label>98002765 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits - Testing
<br/><br/><label>Dewey Class. No.: </label>621.3815 DAV