Metrology and Diagnostic Techniques for Nanoelectronics 
Mudiwa Afolayan  
 - New York  Scitus Academics LLC  2018 
 - vi, 296p.  ill.  28cm. 
<br/><br/><label>ISBN: </label>9781681177199 
<br/><br/><label>Dewey Class. No.: </label>620.5  / AFO