Suzuki, Satoshi <br/><br/>
Encyclopaedia of measuring technology and mechartronics automation in electrical engineering  Fault-Diagnosis applications: model-based condition  v. 3 
Contributors Satoshi Suzuki, Hideki Kakeya, Huaqing Wang, [et al.] 
 - London  Auris Reference 
 - x, 261 p.  ill.  25 cm. 
<br/><br/> Edition 2016 
<br/><br/>Includes bibliographies and index 
<br/><br/><label>ISBN: </label>9781781546239 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metrology
<br/><br/><label>Dewey Class. No.: </label>621.3   / SUZ.3