Quality aspects in spatial data mining 
editors, Alfred Stein, Wenzhong Shi, Wietske Bijker 
 - Boca Raton, FL  CRC Press  2009 
 - xx, 364 p. : ill. ; 24 cm.(alk. paper) 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781420069266 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Geographic information systems<br/>Spatial analysis (Statistics)
<br/><br/><label>Dewey Class. No.: </label>910.285 STE