Proceedings of the 9th international autumn meeting gettering and defect engineering in semiconductor technology : GADEST 2001, S. Tecla, Italy, September 30-October 3, 2001 
editors, V. Raineri ... [et al.] 
 - Uetikon-Zürich, Switzerland ; Enfield, N.H  Sci-Tech Pub. Ltd. ; Trans Tech Pub. Ltd. [distributor]  2002 
 - xviii, 823 p. : ill. ; 25 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9783908450641 
<br/><br/><label>ISSN: </label>2002265757 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrical engineering - Materials - Congresses<br/>Getters - Congresses<br/>Semiconductors - Defects - Congresses<br/>Silicon crystals - Defects - Congresses
<br/><br/><label>Dewey Class. No.: </label>621.38152 RAI