Proceedings of the 7th international autumn meeting gettering and defect engineering in semiconductor technology : GADEST '97, Spa, Belgium, October 5-10, 1997 
editors, and C. Claeys ... [et al.] 
 - Zurich ; Enfield, N.H  Scitec Pub. Ltd. ; Trans Tech Pub. Ltd. [distributor]  [1997] 
 - xv, 538 p. : ill. ; 25 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9783908450276 
<br/><br/><label>ISSN: </label>99221384 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrical engineering - Materials - Congresses<br/>Getters - Congresses<br/>Semiconductors - Congresses<br/>Silicon crystals - Defects - Congresses
<br/><br/><label>Dewey Class. No.: </label>537.622 CLA