Nicolici, Nicola <br/><br/>
Power-constrained testing of VLSI circuits 
by Nicola Nicolici and Bashir M. Al-Hashimi 
 - Boston  Kluwer Academic Publishers  2003 
 - xi, 178 p. : ill. ; 25 cm 
<br/><br/> Includes bibliographical references (p. 163-173) and index 
<br/><br/><label>ISBN: </label>9781402072352 
<br/><br/><label>ISSN: </label>2002043306 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits, Very large scale integration - Protection<br/>Integrated circuits, Very large scale integration - Testing<br/>Semiconductors - Thermal properties
<br/><br/><label>Dewey Class. No.: </label>621.3950287 NIC