Krihnadas Nair, C. G <br/><br/>
Trends in NDE science and technology: proceedings of the 14th world conference on non-destructive testing, New Delhi, 8-13 December 1996 
C.G. Krishnadas Nair, Baldev Raj, C.R.L.Murthy , T.Jayakumar 
 - Rotterdam  A.A. Balkema  c1996 
 - v.4 (various pagination.) ; 25 cm 
<br/><br/> Includes index 
<br/><br/><label>ISBN: </label>9054107405 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scinece technology - Proceedings
<br/><br/><label>Dewey Class. No.: </label>620.1127 KRI