Selected papers on speckle metrology 
Rajpal S. Sirohi, editor 
 - Bellingham, WA  SPIE Optical Engineering Press  c1991 
 - xviii, 668 p. : ill. ; 28 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780819406385 
<br/><br/><label>ISSN: </label>91017832 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Holographic interferometry<br/>Speckle metrology
<br/><br/><label>Dewey Class. No.: </label>681.2 SIR