TY  - BOOK
AU  - Spaeth, Johann-Martin
AU  - Overhof, H
TI  - Point defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions
SN  - 9783540426950
SN  - 200204259
U1  - 621.38152 SPA 
PY  - 2003///
CY  - Berlin
PB  - Springer
KW  - Nuclear magnetic resonance spectroscopy
KW  - Semiconductors - Defects
KW  - Semiconductors - Testing - Methodology
N1  - Includes bibliographical references (p. [467]-484) and index
ER  -