Spaeth, Johann-Martin <br/><br/>
Point defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions 
J.-M. Spaeth, H. Overhof 
 - Berlin  Springer  c2003 
 - xi, 490 p. : ill. ; 24 cm 
<br/><br/> Includes bibliographical references (p. [467]-484) and index 
<br/><br/><label>ISBN: </label>9783540426950 
<br/><br/><label>ISSN: </label>2002042592 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nuclear magnetic resonance spectroscopy<br/>Semiconductors - Defects<br/>Semiconductors - Testing - Methodology
<br/><br/><label>Dewey Class. No.: </label>621.38152 SPA