TY  - BOOK
AU  - Gupta, D
AU  - Jain, H
AU  - Siegel, R. W
TI  - Atomic migration and defects in materials
SN  - 9783908044079
U1  - 531 GUP 
PY  - 1991///
CY  - Brookfield
PB  - SCI-Tech Publications
N1  - Includes bibliographical references and indexes
ER  -