Atomic force microscopy/scanning tunneling microscopy 2 
edited by Samuel H. Cohen and Marcia L. Lightbody 
 - New York  Plenum Press  c1997 
 - ix, 250 p. : ill. ; 26 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780306455964 
<br/><br/><label>ISSN: </label>97009548 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atomic force microscopy<br/>Scanning tunneling microscopy
<br/><br/><label>Dewey Class. No.: </label>502.82 COH