Atomic force microscopy in process engineering 
W. Richard Bowen, Nidal Hilal 
 - 1st ed 
 - Amsterdam  Elsevier/Butterworth-Heinemann  2009 
 - xvi, 283 p. : ill 
<br/><br/><label>ISBN: </label>9781856175173 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Atomic force microscopy<br/>Production engineering
<br/><br/><label>Dewey Class. No.: </label>660 BOW