Advances in materials characterization 
editors, G Amarendra, Baldev Raj, M H Manghnani ; editor-in-chief, Baldev Raj 
 - Hyderabad ; Boca Raton  Universities Press ; CRC Press  2007 
 - [iv], 220 p. : ill. (some col.) ; 25cm 
<br/><br/> Includes bibliographical references and index. <strong>Contents:</strong>  <ul> <li>Introduction to Materials Characterization</li> <li>Atomistic Characterization of Materials using Scanning Tunneling Microscopy / ​Spectroscopy</li> <li>Recent Advances in Characterization of Materials using Electron Microscopy</li> <li>X-ray Reflectivity: A Non-destructive Technique for the Study of Thin Films and Multilayers</li> <li>Latest Trends in Ultrasonic Technique for Materials Characterization</li> <li>Characterization of Soft Condensed Matter using Confocal Microscopy</li> <li>Characterization of Defects in Semiconductor Devices using Positron Annihilation</li> <li>Elasticity Characterization of Covalent (B-C-N) Hard Materials and Films by Brillouin Scattering.</li> </ul> 
<br/><br/><label>ISBN: </label>9781420047295 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials - Testing.
<br/><br/><label>Dewey Class. No.: </label>620.110287 AMA