TY  - BOOK
AU  - Duparré, Angela
AU  - Singh, Bhanwar
ED  - Society of Photo-optical Instrumentation Engineers
TI  - Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA
SN  - 9780819450616
SN  - 200429872
U1  - 621.381 DUP 
PY  - 2003///
CY  - Bellingham, Wash
PB  - SPIE
KW  - Nanotechnology - Congresses
KW  - Optical measurements - Congresses
KW  - Optoelectronic devices - Congresses
KW  - Optoelectronics - Congresses
KW  - Semiconductors - Characterization - Congresses
KW  - Thin films - Optical properties - Congresses
N1  - Includes bibliographical references and index
ER  -