Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA 
Angela Duparré, Bhanwar Singh, chairs/editors, ; sponsored ... by SPIE--the International Society for Optical Engineering 
 - Bellingham, Wash  SPIE  2003 
 - x, 402 p. : ill. ; 28 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780819450616 
<br/><br/><label>ISSN: </label>2004298723 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanotechnology - Congresses<br/>Optical measurements - Congresses<br/>Optoelectronic devices - Congresses<br/>Optoelectronics - Congresses<br/>Semiconductors - Characterization - Congresses<br/>Thin films - Optical properties - Congresses
<br/><br/><label>Dewey Class. No.: </label>621.381 DUP