TY  - BOOK
AU  - Duparré, Angela
AU  - Singh, Bhanwar
ED  - Boeing Company, Society of Photo-optical Instrumentation Engineers
TI  - Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA
SN  - 9780819445469
SN  - 200353527
U1  - 621.36 DOP 
PY  - 2002///
CY  - Bellingham, Wash
PB  - SPIE
KW  - Information storage and retrieval systems - Congresses
KW  - Metrology - Congresses
KW  - Optical materials - Congresses
KW  - Semiconductors - Characterization - Congresses
N1  - Includes bibliographical references and index
ER  -