Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA 
Angela Duparré, Bhanwar Singh, chairs/editors, ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company (USA) ... [et al.] 
 - Bellingham, Wash  SPIE  c2002 
 - viii, 192 p. : ill. ; 28 cm 
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780819445469 
<br/><br/><label>ISSN: </label>2003535275 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Information storage and retrieval systems - Congresses<br/>Metrology - Congresses<br/>Optical materials - Congresses<br/>Semiconductors - Characterization - Congresses
<br/><br/><label>Dewey Class. No.: </label>621.36 DOP