Sivaraman, Mukund <br/><br/>
A unified approach for timing verification and delay fault testing 
Mukund Sivaraman and Andrzej J. Strojwas 
 - Boston  Kluwer Academic  1998 
 - xv, 155 p. : ill. ; 25 cm 
<br/><br/> Includes bibliographical references (p. [139]-152) and index 
<br/><br/><label>ISBN: </label>9780792380795 
<br/><br/><label>ISSN: </label>97042061 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Delay faults (Semiconductors)<br/>Digital integrated circuits - Design and construction - Data processing<br/>Digital integrated circuits - Testing<br/>Integrated circuits - Verification
<br/><br/><label>Dewey Class. No.: </label>621.3950287 SIV