TY  - BOOK
AU  - Krihnadas Nair, C. G
AU  - Jayakumar, T
AU  - Murthy, C. R. L
AU  - Raji, Baldev
ED  - World Conference on Non-Destructive Testing
TI  - Trends in NDE science and technology: proceedings of the 14th world conference on non-destructive testing, New Delhi, 8-13 December 1996
SN  - 9054107480
U1  - 620.1127 KRI 
PY  - 1996///
CY  - Rotterdam
PB  - A.A. Balkema
KW  - Scinece technology - Proceedings
N1  - Includes index
ER  -