TY  - BOOK
AU  - Bardeleben, H J Von
TI  - Proceedings of the 14th international conference on defects in semiconductors : Paris, France, August 18-22, 1986
SN  - 9780878495511
U1  - 621.38152 BAR 
PY  - 1986///
CY  - Zurich, Switerland
PB  - Trans Tech Publications
KW  - Semiconductors -- Defects -- Congresses
N1  - Includes bibliographical references and indexes. Part II: 435-826 p. Part III: 827-1270 p
ER  -