Optical pattern recognition XIV : 24-25 April, 2003, Orlando, Florida, USA 
David P. Casasent, Tien-Hsin Chao, chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering 
 - Bellingham, WA  SPIE  2003 
 - vii, 332 p. : ill. ; 28 cm. 
<br/><br/> Includes bibliographical references and author index 
<br/><br/><label>ISBN: </label>9780819449665 
<br/><br/><label>ISSN: </label>2004270148 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Optical pattern recognition - Congresses
<br/><br/><label>Dewey Class. No.: </label>006.42 CAS