Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany 
Wolfgang Osten, Christophe Gorecki, Erik Novak, editors ; sponsored by SPIE Europe ; cooperating organizations, EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e. V. (Germany) 
 - Bellingham, WA  SPIE  c2007 
 - 2 v. (various pagings) : ill. ; 28 cm. 
<br/><br/> Includes bibliographical references and author index 
<br/><br/><label>ISBN: </label>9780819467584 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Optical detectors - Industrial applications - Congresses<br/>Optical instruments - Industrial applications - Congresses<br/>Quality control - Optical methods - Congresses
<br/><br/><label>Dewey Class. No.: </label>670.425 OST