Optical measurement systems for industrial inspection VI : 15-18 June 2009, Munich, Germany 
Peter H. Lehmann, editor ; sponsored by SPIE Europe ; cooperating organizations, EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e. V. (Germany) 
 - Bellingham, WA  SPIE  2009 
 - 2 v. : ill. ; 28 cm. 
<br/><br/> Includes bibliographical references and author index 
<br/><br/><label>ISBN: </label>9780819476722 
<br/><br/><label>ISSN: </label>2010459359 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Optical detectors - Industrial applications - Congresses<br/>Optical instruments - Industrial applications - Congresses<br/>Quality control - Optical methods - Congresses
<br/><br/><label>Dewey Class. No.: </label>670.425 LEH