Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany 
Angela Duparré, Roland Geyl, Lingli Wang, chairs/editors ; sponsored by SPIE Europe ; cosponsored by Friedrich-Schiller-Universität Jena (Germany) ; cooperating organizations, EOS--European Optical Society, DGaO--Deutsche Gesellschaft für Angewandte Optik e. V. (Germany), Optonet e. V. (Germany) 
 - Bellingham, WA  SPIE  c2005 
 - 1 v. (various pagings) : ill. ; 28 cm 
<br/><br/> Includes bibliographical references and author index 
<br/><br/><label>ISBN: </label>9780819459831 
<br/><br/><label>ISSN: </label>2006274577 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metrology - Congresses<br/>Optical instruments - Design and construction - Congresses<br/>Optical instruments - Testing - Congresses<br/>Optical materials - Congresses
<br/><br/><label>Dewey Class. No.: </label>681.4 DUP