Optical fabrication, testing and metrology : 30 September-3 October 2003 
Roland Geyl, David Rimmer, Lingli Wang, chairs/editors ; sponsored... by SPIE--the International Society for Optical Engineering ; cooperating organizations, EOS--European Optical Society, GIFO--Groupement des Industries Française d'Optique (France), [and] SFO--Société Française d'Optique (France) 
 - Bellingham, WA  SPIE  c2004 
 - xxxi, 518 p. : ill. ; 28 cm 
<br/><br/> Earlier conferences have title: Optical fabrication and testing. Includes bibliographical references and author index 
<br/><br/><label>ISBN: </label>9780819451361 
<br/><br/><label>ISSN: </label>2004302614 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metrology - Congresses<br/>Optical instruments - Design and construction - Congresses<br/>Optical instruments - Testing - Congresses<br/>Optical materials - Congresses
<br/><br/><label>Dewey Class. No.: </label>681.4 GEY