TY  - BOOK
AU  - Farrell, Patrick V
AU  - Hanssen, Leonard Matheus
ED  - Society of Photo-optical Instrumentation Engineers
TI  - Optical diagnostics : 3-4 August, 2005, San Diego, California, USA
SN  - 9780819458858
SN  - 200628104
U1  - 535 HAN 
PY  - 2005///
CY  - Bellingham, WA
PB  - SPIE
KW  - Materials - Testing - Congresses
KW  - Optical measurements - Congresses
KW  - Reflectance - Congresses
KW  - Refractive index - Congresses
N1  - Includes bibliographical references and author index
ER  -