Optical diagnostics : 3-4 August, 2005, San Diego, California, USA 
Leonard M. Hanssen, Patrick V. Farrell, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering 
 - Bellingham, WA  SPIE  c2005 
 - 1 v. (various pagings) : ill. ; 28 cm. 
<br/><br/> Includes bibliographical references and author index 
<br/><br/><label>ISBN: </label>9780819458858 
<br/><br/><label>ISSN: </label>2006281048 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Materials - Testing - Congresses<br/>Optical measurements - Congresses<br/>Reflectance - Congresses<br/>Refractive index - Congresses
<br/><br/><label>Dewey Class. No.: </label>535 HAN