TY  - BOOK
AU  - Suezawa, Masashi
AU  - Katayama-Yoshida, Hiroshi
TI  - Defects in semiconductors 18 : proceedings of the 18th International Conference on defects in semiconductors
SN  - 878497137
U1  - 621.38152 SUE 
PY  - 1992///
CY  - Switzerland
PB  - Trans Tech Publications
KW  - Semiconductors - Defects - Congresses
N1  - Includes bibliographies and indexes
ER  -