Suezawa, Masashi <br/><br/>
Defects in semiconductors 18 : proceedings of the 18th International Conference on defects in semiconductors 
Masashi Suezawa, Hiroshi Katayama-Yoshida 
 - Switzerland  Trans Tech Publications  1992 
 - 1107 p. : ill. ; 24 cm 
<br/><br/> Includes bibliographies and indexes 
<br/><br/><label>ISBN: </label>878497137 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors - Defects - Congresses
<br/><br/><label>Dewey Class. No.: </label>621.38152 SUE