Advances in imaging and electron physics 
ed. by Peter W. Hawkes ; guest eds., Pier Giorgio Merli,...[et al] 
 - 1st ed 
 - Amsterdam ; San Diego  Elsevier / Academic Press  2006 
 - xvi.;328p. : ill. ; 24 cm 
<br/><br/> includes index 
<br/><br/><label>ISBN: </label>9780120147861 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy.<br/>Microscopy.
<br/><br/><label>Dewey Class. No.: </label>537.56 HAW.144