Nonintrusive inspection, structures monitoring, and smart systems for homeland security : 27-28 February 2006, San Diego, California, USA 
Aaron A. Diaz ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; co-sponsored by ASME--American Society of Mechanical Engineering (USA) 
 - Bellingham, WA  SPIE  c2006 
 - 1 v. (various pagings) : ill. ; 28 cm 
<br/><br/> Includes bibliographical references and author index 
<br/><br/><label>ISBN: </label>9780819462312 
<br/><br/><label>ISSN: </label>2007275550 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Automatic data collection systems - Congresses<br/>Bridges - Inspection - Congresses<br/>Building inspection - Congresses<br/>National security - United States - Congresses<br/>Sensor networks - Congresses
<br/><br/><label>Dewey Class. No.: </label>681.2 DIA